SOURCES FOR ARTICLES IN ENGINEERING

 

Engineering Index - Introduction
Engineering Index - Details
INSPEC - Introduction
INSPEC - Details
Finding current scholarly journal articles

Computer Science Bibliography

General engineering sources include two major engineering periodical indexes. Engineering Index (since 1884) along with its derivatives, is produced by Elsevier Engineering Information (EEI). It covers all engineering specialties. INSPEC  consists of Physics Abstracts (Series A), Electrical and Electronics Abstracts (Series B), Computer and Control Abstracts (Series C), and Information Technology (Series D). Another scholarly database is Current Contents; all three sources are briefly described in this section and later elaborated under separate headings.

The Engineering Index. 1884+. 1 Castle Point Terrace, Hoboken, New Jersey, Engineering Information Inc., now Elsevier Engineering Information Inc. To see a context where Ei fit in, visit the ATEIS-Articles visual. For more detail, go to Engineering Index.

This is the major bibliographic resource in main engineering disciplines, including:

  • Chemical engineering
  • Computers and electrical engineering
  • Mechanical engineering
  • Civil engineering
  • Industrial management
  • Metals and mining


Engineering Index is available in several media: print (monthly and annual), CD-ROM, online, and Web-based. The database lists over 5,800 serial publications (e.g., journals, conferences, and report series). All are covered in Ei Page One. Of these, nearly 3,000 are considered core to engineering and are indexed and abstracted completely. Nearly 900 multidisciplinary, scientific and trade journals are covered selectively.

Available on CD-ROM include the following engineering specialty discs:

Ei ChemDisc(r)

Ei CivilDisc(tm)

Ei EEDisc(tm)

Ei Energy & Environment(tm)

Ei Manufacturing(tm)

Ei MechDisc(tm)

Engineering Conferences & Reports

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INSPEC is published by The Institution of Electrical Engineers, founded in 1871 as one of the largest engineering societies with its international membership of over 130,000 professionals in all areas of engineering. IEE is one of the major publishers of engineering information sources, including INSPEC. It is available in hard copy, on CD-ROM, online via commercial vendors, and library portals such as Melvyl®.

The three major components of Inspec are the following four subfiles:

PHYSICS ABSTRACTS

series A: 1898 to present

ELECTRICAL and ELECTRONICS Abstracts

series B: 1898 to present

CCOMPUTER and CONTROL Abstracts

series C: 1966 to present

INFORMATION TECHNOLOGY

series D: 1989 to present

Thus, unless instructed differently, when you search Inspec, you are automatically searching all four abstracting services. For details, go to INSPEC.

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Finding current scholarly journal articles

Many engineering fields are well researched and interdisciplinary in nature; for materials sciences, aerospace, environmental, and other engineering areas, a good database is CURRENT CONTENTS which is available via Web based Melvyl®, its telnet version, or other portals on the subscription basis.

Its welcome page gives basic information about its size, currency, and scope:

             Welcome to the MELVYL CURRENT CONTENTS Article Database

Contents:  As of 02/14/01, the database contains 10,417,566 citations from over 6500 journals indexed by the Institute for Scientific Information since July 1989; the database is updated weekly. Major areas covered:

Engineering/Technology/Applied Sciences

Social/Behavioral Sciences

Physical/Chemical/Earth Sciences

Arts/Humanities

Agriculture/Biology/Environmental Sciences

Clinical Medicine; Life Sciences

     


NOTE for UC affiliated searchers:

The following is a search template that you can use in your searching the CC database. Here is how:

Using the Web-based interface, type in title word(s):

glass (title words) produces 21634 items (as of 2/9/01)

click on the MODIFY BUTTON to narrow down the result by combining (AND) with the author's name:

Mackenzie JD  This produces 13 items, which you can display in different formats.

If you are accessing Melvyl via the telnet, use the command mode; the following script may be useful:

vt100 (and switch to the Current Contents database); type in:

cc

At the CC-> prompt, instruct the computer to find information about glass. Use the FIND command and TITLE WORD followed by the search word:

cc->f tw glass

To narrow down your search, you have decided to limit to a known researcher on glass. Each instruction has three parts as follows:

COMMAND+INDEX+SEARCH WORDS

Example #1: Research on glass (by Prof. Mackenzie at UCLA)

CC-> f tw glass (Search result:  over 21,634 citations in the CC article database)

CC-> and f pa mackenzie john d (Search results: 13 citations in the database)

CC-> save set (Action:  all 13 citations in the CC database are saved as Set 1)

CC-> f set 1 and lan eng and at ucla (12 citations, all locally available--at UCLA)

CC-> d 2-4 (displays records 2 through 4):

2. Mackenzie, JD. The future of glass research.

     GLASS TECHNOLOGY, 1996 DEC, V37 N6:181-184.

     Pub type:  Editorial.

3. HU Y; ZHENG H; MACKENZIE JD.

     HIGH-T-C SUPERCONDUCTING BI(AL)-CA-SR-CU-O GLASS-CERAMIC FIBRES DRAWN FROM GLASS PREFORMS.

  •      JOURNAL OF MATERIALS SCIENCE, 1995 AUG 1, V30 N15:3913-3918.

         AT: UCLA  SEL/EMS   TA 401 J8272         B1-32(1966-97)U33N1-2(1998)

    4. ROYLE M; MACKENZIE J; TAYLOR J; SHARMA M; and others.

         DENSITIES, GLASS TRANSITION TEMPERATURES, AND STRUCTURAL MODELS RESULTING FROM EXTREMELY MODIFIED CAESIUM AND RUBIDIUM BORATE GLASSES. JOURNAL OF NON-CRYSTALLINE SOLIDS, 1994 NOV, V177 NOV:242-248. SEL/EMS   TP 845 J826         

    B1-60(1968/9-83)B61-62PT1(1984).B63-200(1984-96)U201N1-3(1996/7)U202N1-3(1 996/7) U203(1996/7)U204N1-3(1996/7):U205-207(1996):U208N1-3(1996/7)U209N1-3(1997 )U210N1-3(1997).U211N1-3(1997).U212N1-3(1997).U213-214(1997).U215N1-3(1997 )U216N1-3(1997)U217N1-3(1997)U218N1-3(1997)U219(1997)U220N1-3(1997)U221N 1-3(1997)U222N1-3(1997)U223N1-3(1998) Current issue shelves (PE title:  Journal of non-crystalline solids.)

Example #2: Publications on behavior in solid waste ash by a known researcher

CC-> f tw municipal solid waste ash  (66 citations in the CC article database)

CC-> save set (Search result:  66 citations in the CC article database, saved as Set 2)

CC-> f set 2 and f pa krzanowski

Search request: F SET 2 AND F PA KRZANOWSKI #  (3 citations in the CC database)

CC-> d 1 long (displays first record in a long format):

1.

Author:      EIGHMY TT (Reprint); EUSDEN JD; KRZANOWSKI JE; DOMINGO DS; and others.

  • Address:     UNIV NEW HAMPSHIRE,ENVIRONM RES GRP,A115 KINGSBURY HALL, DURHAM, NH 03824, USA (Reprint); BATES COLL,DEPT GEOL, LEWISTON, ME 04240, USA; UNIV NEW HAMPSHIRE,DEPT MECH ENGN, DURHAM, NH 03824, USA; MIT,CTR MAT SCI & ENGN,ANALYT SHARED EXPTL FACIL, CAMBRIDGE, MA 02139, USA; and others.

    Title:       COMPREHENSIVE APPROACH TOWARD UNDERSTANDING ELEMENT SPECIATION AND LEACHING BEHAVIOR IN MUNICIPAL SOLID WASTE INCINERATION ELECTROSTATIC PRECIPITATOR ASH.

    In: ENVIRONMENTAL SCIENCE & TECHNOLOGY, 1995 MAR, V29 N3:629-646.

    GA Number:   QJ908.

    Language:    English.

    Pub Type:    Article.

    References:  50.

    CC Subfile:  AGRI, ENGI, ENGI.

    CC Edition:  Agriculture, Biology, & Environmental Science, V26 N14; Engineering, Computing & Technology, V26 N14.

    Subject Category:  Environment/Ecology; Environmental/Civil-ENGI; Environmental Engineering/Energy.

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    Computer Science Bibliography is maintained by Michael Ley of the University of Trier, Germany. This source gives:
    Journal titles include:

  • Academic Press Journals
  • ACM Journals (CACM, ACM Transactions on..., Computing Surveys, Journal of the ACM, SIGMOD Record, SIGMOD DiSC, Operating Systems Review, etc.
  • Baltzer Journals (Annals of Mathematics and AI, Annals of Software Engineering, Mobile Networks and Applications, Queuing Systems, Wireless Networks, etc.)
  • Blackwell Science Journals
  • Cambridge University Press Journals
  • Elsevier/North Holland/Pergamon Journals
  • IEEE-CS Journals
  • Kluwer Journals
  • MIT Press Journals
  • Oxford University Press
  • SIAM--Society for Industrial and Applied Mathematics
  • Springer Journals
  • Wiley Scientific
  • Reviews: ACM SIGMOD Digital Review

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